000 01448nam a2200385 i 4500
001 000055793
003 BD-KhUET
005 20120709145657.0
008 120709s1977 nyua b 000 0 eng
010 _a 76017013
020 _a0070042306 :
_c17.00
035 _aMITb10055793
035 _a(OCoLC)02225095
035 _aGLIS00055793
040 _aDLC
_cDLC
_dMYG
_dBD-KhUET
049 _aMYGE
_c[816553]
050 0 _aTK7867
_b.B36 1977
082 _221
_a621.38132
099 _aTK7867.B36 1977
100 1 _aBecker, Peter W.
_95399
245 1 0 _aDesign of systems and circuits for maximum reliability or maximum production yield /
_cPeter W. Becker, Finn Jensen.
260 _aNew York :
_bMcGraw-Hill,
_cc1977.
300 _axiv, 293 p. :
_bill. ;
_c24 cm.
504 _aBibliography: p. 281-289.
650 0 _aElectronic circuit design
_xData processing.
_95400
650 0 _aElectronic apparatus and appliances
_xDesign and construction
_xData processing.
_95401
650 0 _aElectronic apparatus and appliances
_xReliability
_xData processing.
_95402
700 1 _aJensen, Finn,
_d1937-
_95403
910 _a816553sg780726
942 _2ddc
_cBK
952 _p3010008298
_40
_eThe Asia Foundation
_00
_bKUETCL
_10
_o621.38132 BEC
_d1981-9-30
_t1
_70
_cGEN
_2ddc
_gGift
_yBK
_aKUETCL
999 _c6084
_d6084