000 | 01448nam a2200385 i 4500 | ||
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001 | 000055793 | ||
003 | BD-KhUET | ||
005 | 20120709145657.0 | ||
008 | 120709s1977 nyua b 000 0 eng | ||
010 | _a 76017013 | ||
020 |
_a0070042306 : _c17.00 |
||
035 | _aMITb10055793 | ||
035 | _a(OCoLC)02225095 | ||
035 | _aGLIS00055793 | ||
040 |
_aDLC _cDLC _dMYG _dBD-KhUET |
||
049 |
_aMYGE _c[816553] |
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050 | 0 |
_aTK7867 _b.B36 1977 |
|
082 |
_221 _a621.38132 |
||
099 | _aTK7867.B36 1977 | ||
100 | 1 |
_aBecker, Peter W. _95399 |
|
245 | 1 | 0 |
_aDesign of systems and circuits for maximum reliability or maximum production yield / _cPeter W. Becker, Finn Jensen. |
260 |
_aNew York : _bMcGraw-Hill, _cc1977. |
||
300 |
_axiv, 293 p. : _bill. ; _c24 cm. |
||
504 | _aBibliography: p. 281-289. | ||
650 | 0 |
_aElectronic circuit design _xData processing. _95400 |
|
650 | 0 |
_aElectronic apparatus and appliances _xDesign and construction _xData processing. _95401 |
|
650 | 0 |
_aElectronic apparatus and appliances _xReliability _xData processing. _95402 |
|
700 | 1 |
_aJensen, Finn, _d1937- _95403 |
|
910 | _a816553sg780726 | ||
942 |
_2ddc _cBK |
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952 |
_p3010008298 _40 _eThe Asia Foundation _00 _bKUETCL _10 _o621.38132 BEC _d1981-9-30 _t1 _70 _cGEN _2ddc _gGift _yBK _aKUETCL |
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999 |
_c6084 _d6084 |