Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.
Contributor(s): Gupta, D. C. (Dinesh C.)
| Bacher, Fred R | Hughes, William M.
Material type: 
BookPublisher: West Conshohocken, PA : ASTM, c1998Description: 392 p. : ill. ; 24 cm.ISBN: 0803124899.Subject(s): Semiconductors -- Testing -- Congresses | Service life (Engineering) -- Forecasting -- Congresses | Electronic measurements -- CongressesDDC classification: 621.38152
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
Central Library, KUET General Stacks | 621.38152 REC (Browse shelf) | 1 | Available | 3010032500 |
Total holds: 0
Browsing Central Library, KUET Shelves , Shelving location: General Stacks Close shelf browser
|
|
|
|
|
|
|
||
| 621.38152 ORT The story of semiconductors / | 621.38152 ORT The story of semiconductors / | 621.38152 PRO Experiments in CMOS technology / | 621.38152 REC Recombination lifetime measurements in silicon / | 621.38152 RUT Solid-state electronics : | 621.38152 RUT Solid-state electronics / | 621.38152 SEM Semiconductor devices and circuits / |
Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.
"STP 1340."
Includes bibliographical references and indexes.
There are no comments for this item.