Transmission electron microscopy of silicon VLSI circuits and structures / R.B. Marcus and T.T. Sheng.
By: Marcus, R. B. (Robert B.).
Contributor(s): Sheng, T. T. (Tai Tsu).
Material type:
BookPublisher: New York : Wiley, c1983Description: x, 217 p. : ill. ; 29 cm.ISBN: 0471092517.Subject(s): Integrated circuits | Transmission electron microscopyDDC classification: 621.38173
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode | Item holds |
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Central Library, KUET General Stacks | 621.38173 MAR (Browse shelf) | 1 | Available | 3010010110 |
Total holds: 0
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| 621.38173 HON Op amps and linear integrated circuits / | 621.38173 JAI Digital electronics practice using integrated circuits / | 621.38173 LEN Manual for integrated circuit users / | 621.38173 MAR Transmission electron microscopy of silicon VLSI circuits and structures / | 621.38173 MCC Digital logic design and applications : | 621.38173 MIL Integrated electronics : | 621.38173 MIL Integrated electronics : |
"A Wiley-Interscience publication."
Includes bibliographical references and index.
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