Leng, Y.
Materials characterization : introduction to microscopic and spectroscopic methods / Yang Leng. - Second edition. - 1 online resource (xiv, 376 pages) : illustrations
Includes bibliographical references and index.
Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
Text in English.
9783527670772 3527670777 9783527670802 3527670807 9783527670796 3527670793 9783527670789 3527670785 9780470822982 0470822988
Materials.
Materials--Analysis.
Electron microscopy.
Materials--Analysis.
TECHNOLOGY & ENGINEERING--Engineering (General)
TECHNOLOGY & ENGINEERING--Reference.
Materials.
Materials--Analysis.
Werkstoffprüfung
Mikrostruktur
Mikroskopie
Spektroskopie
Thermoanalyse
Electronic books.
TA403 / .L433 2013eb
620.11
Materials characterization : introduction to microscopic and spectroscopic methods / Yang Leng. - Second edition. - 1 online resource (xiv, 376 pages) : illustrations
Includes bibliographical references and index.
Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis.
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy).
Text in English.
9783527670772 3527670777 9783527670802 3527670807 9783527670796 3527670793 9783527670789 3527670785 9780470822982 0470822988
Materials.
Materials--Analysis.
Electron microscopy.
Materials--Analysis.
TECHNOLOGY & ENGINEERING--Engineering (General)
TECHNOLOGY & ENGINEERING--Reference.
Materials.
Materials--Analysis.
Werkstoffprüfung
Mikrostruktur
Mikroskopie
Spektroskopie
Thermoanalyse
Electronic books.
TA403 / .L433 2013eb
620.11